Concept information
Preferred term
Electron Probe Microanalysis
Type
-
Topical Descriptor
Broader concept
Entry terms
- Microanalysis, Electron Probe
- Microanalysis, X-Ray
- Microscopy, Electron, X-Ray Microanalysis
- Spectrometry, X Ray Emission, Electron Microscopic
- Spectrometry, X-Ray Emission, Electron Microscopic
- Spectrometry, X Ray Emission, Electron Probe
- Spectrometry, X-Ray Emission, Electron Probe
- X Ray Emission Spectrometry, Electron Microscopic
- X-Ray Emission Spectrometry, Electron Microscopic
- X Ray Emission Spectrometry, Electron Probe
- X-Ray Emission Spectrometry, Electron Probe
- X Ray Microanalysis
- X-Ray Microanalysis
- X Ray Microanalysis, Electron Microscopic
- X-Ray Microanalysis, Electron Microscopic
- X Ray Microanalysis, Electron Probe
- X-Ray Microanalysis, Electron Probe
Scope note
- Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
History note
- 70(67)
In other languages
-
Finnish
-
Swedish
-
Röntgenmikroanalys
-
XRMA
URI
http://www.yso.fi/onto/mesh/D004577
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