Concept information
Preferred term
Microscopy, Electron, Scanning
Type
-
Topical Descriptor
Broader concept
Entry terms
- Electron Microscopies, Scanning
- Electron Microscopy, Scanning
- Electron Scanning Microscopies
- Electron Scanning Microscopy
- Microscopies, Electron Scanning
- Microscopies, Scanning Electron
- Microscopy, Electron Scanning
- Microscopy, Scanning Electron
- Scanning Electron Microscopies
- Scanning Electron Microscopy
- Scanning Microscopies, Electron
- Scanning Microscopy, Electron
Note
- do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM
Scope note
- Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
History note
- 72(69)
In other languages
-
Finnish
-
Swedish
-
Mikroskopi, svepelektron
URI
http://www.yso.fi/onto/mesh/D008855
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