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Investigative Techniques > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force
... > Diagnosis > Diagnostic Techniques and Procedures > Diagnostic Imaging > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force
... > Technology, Industry, and Agriculture > Engineering > Optics and Photonics > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force
... > Natural Science Disciplines > Physics > Optics and Photonics > Microscopy > Microscopy, Scanning Probe > Microscopy, Atomic Force

Preferred term

Microscopy, Atomic Force  

Type

  • Topical Descriptor

Broader concept

Related concepts

Entry terms

  • Atomic Force Microscopies
  • Atomic Force Microscopy
  • Force Microscopies
  • Force Microscopies, Scanning
  • Force Microscopy
  • Force Microscopy, Scanning
  • Microscopies, Atomic Force
  • Microscopies, Force
  • Microscopies, Scanning Force
  • Microscopy, Force
  • Microscopy, Scanning Force
  • Scanning Force Microscopies
  • Scanning Force Microscopy

Scope note

  • A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

History note

  • 95

In other languages

URI

http://www.yso.fi/onto/mesh/D018625

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RDF/XML TURTLE JSON-LD Created 4/16/94, last modified 7/7/04