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Investigative Techniques > Chemistry Techniques, Analytical > Mass Spectrometry > Spectrometry, Mass, Secondary Ion

Preferred term

Spectrometry, Mass, Secondary Ion  

Type

  • Topical Descriptor

Broader concept

Entry terms

  • Mass Spectrometry, Secondary Ion
  • Mass Spectroscopy, Secondary Ion
  • Secondary Ion Mass Spectrometry
  • Secondary Ion Mass Spectrometry Microscopy
  • Secondary Ion Mass Spectroscopy
  • Secondary Ion Mass Spectroscopy Microscopy
  • SIMS Microscopy
  • Spectroscopy, Mass, Secondary Ion

Note

  • for SIMS microscopy, coordinate with type of microscopy

Scope note

  • A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions.

History note

  • 95

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URI

http://www.yso.fi/onto/mesh/D018629

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RDF/XML TURTLE JSON-LD Created 5/12/94, last modified 7/5/06