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Investigative Techniques > Microscopy > Microscopy, Scanning Probe
Diagnosis > Diagnostic Techniques and Procedures > Diagnostic Imaging > Microscopy > Microscopy, Scanning Probe
Technology, Industry, and Agriculture > Engineering > Optics and Photonics > Microscopy > Microscopy, Scanning Probe
Natural Science Disciplines > Physics > Optics and Photonics > Microscopy > Microscopy, Scanning Probe

Preferred term

Microscopy, Scanning Probe  

Type

  • Topical Descriptor

Broader concept

Narrower concepts

Entry terms

  • Scanning Probe Microscopy

Scope note

  • Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).

History note

  • 2000; use MICROSCOPY, ATOMIC FORCE 1999

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URI

http://www.yso.fi/onto/mesh/D020527

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